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Scanning Electron Microscopy

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Scanning Electron Microscopy
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40 064,00 JPY
Typical price9 768,07 PLN
Lowest (90 days)298,53 PLN
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Last updated1 settimana fa
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2026-08-08 2026-08-15
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2026-08-08298,53
2026-08-15298,53
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SP SpringerNatureLink Shop INT 40 039,00 JPY 25,00 JPY 40 064,00 JPY Disponibile 1 settimana fa View offer
SP Springer Nature Author 40 039,00 JPY free 40 039,00 JPY Disponibile 1 settimana fa View offer
SP SpringerNatureLink Shop INT 299,00 USD free 299,00 USD Disponibile 1 settimana fa View offer
SP SpringerNatureLink Shop INT 299,00 USD 29,00 USD 328,00 USD Disponibile 1 settimana fa View offer
SP SpringerNatureLink Shop INT 330,00 EUR 15,00 EUR 345,00 EUR Disponibile 1 settimana fa View offer

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EAN 9783540389675
Springer Nature
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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

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