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Scanning Electron Microscopy

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2026-08-08 2026-08-15

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2026-08-08	298,53
2026-08-15	298,53

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SP SpringerNatureLink Shop INT	40 039,00 JPY	25,00 JPY	40 064,00 JPY	Dostupné	před 6 dny	View offer
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EAN 9783540389675

Springer Nature

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.