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Scanning Electron Microscopy

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40 064,00 JPY

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2026-08-08 2026-08-15

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EAN 9783540389675

Springer Nature

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.