Pricelists.org Pricelists.org 로그인 가입하기

Electron Crystallography

☆☆☆☆☆ (0 reviews)
Show price history
Electron Crystallography
Lowest price (incl. delivery)
54 339,00 JPY
Typical price11 207,13 PLN
Lowest (90 days)400,89 PLN
Offers6
Last updated1주 전
See best offer
Price history (90 days)
Full history
2026-08-08 2026-08-15
가격 이력
업데이트 일시가격
2026-08-08406,59
2026-08-15400,89
판매자 Product price Delivery 합계 재고 여부 Updated
SP SpringerNatureLink Shop INT 54 339,00 JPY free 54 339,00 JPY 구매 가능 6일 전 View offer
SP Springer Nature Author 54 339,00 JPY 15,00 JPY 54 354,00 JPY 구매 가능 1주 전 View offer
SP SpringerNatureLink Shop INT 379,99 USD free 379,99 USD 구매 가능 6일 전 View offer
SP SpringerNatureLink Shop INT 449,99 USD free 449,99 USD 구매 가능 6일 전 View offer
SP SpringerNatureLink Shop INT 449,99 USD 19,00 USD 468,99 USD 구매 가능 6일 전 View offer
SP SpringerNatureLink Shop INT 417,99 EUR free 417,99 EUR 구매 가능 6일 전 View offer

가격과 재고 여부는 변경될 수 있습니다. 마지막 업데이트: 08.08.2026 23:40.

EAN 9789048149650
Springer Nature
0,0
☆☆☆☆☆
0 reviews
5★ 0%
4★ 0%
3★ 0%
2★ 0%
1★ 0%

Product reviews

Rating
No reviews yet — be the first!
The re-emergent field of quantitative electron crystallography is described by some of its most eminent practitioners. They describe the theoretical framework for electron scattering, specimen preparation, experimental techniques for optimum data collection, the methodology of structure analysis and refinement, and a range of applications to inorganic materials (including minerals), linear polymers, small organic molecules (including those used in nonlinear optical devices), incommensurately modulated structures (including superconductors), alloys, and integral membrane proteins. The connection between electron crystallography and X-ray crystallography is clearly defined, especially in the utilisation of the latest methods for direct determination of crystallographic phases, as well as the unique role of image analysis of high-resolution electron micrographs for phase determination. Even the aspect of multiple beam dynamic diffraction (once dreaded because it was thought to preclude ab initio analysis) is considered as a beneficial aid for symmetry determination as well as the elucidation of crystallographic phases, and as a criterion for monitoring the progress of structure refinement. Whereas other texts have hitherto preferentially dealt with the analysis of electron diffraction and image data from thin organic materials, this work discusses - with considerable optimism - the prospects of looking at `harder' materials, composed of heavier atoms. Audience: Could be used with profit as a graduate-level course on electron crystallography. Researchers in the area will find a statement of current progress in the field.

Similar products