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Sampling and Sample Preparation

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Sampling and Sample Preparation
Lowest price (incl. delivery)
14 328,00 JPY
Typical price1 042,14 PLN
Lowest (90 days)71,50 PLN
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Last updated1주 전
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Price history (90 days)
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2026-08-08 2026-08-15
가격 이력
업데이트 일시가격
2026-08-0884,99
2026-08-1571,50
판매자 Product price Delivery 합계 재고 여부 Updated
SP SpringerNatureLink Shop INT 14 299,00 JPY 29,00 JPY 14 328,00 JPY 구매 가능 3일 전 View offer
SP Springer Nature Author 14 299,00 JPY 29,00 JPY 14 328,00 JPY 구매 가능 1주 전 View offer
SP SpringerNatureLink Shop INT 99,99 USD 25,00 USD 124,99 USD 구매 가능 3일 전 View offer
SP SpringerNatureLink Shop INT 109,99 USD 29,00 USD 138,99 USD 구매 가능 3일 전 View offer
SP SpringerNatureLink Shop INT 109,99 USD 19,00 USD 128,99 USD 구매 가능 3일 전 View offer
SP SpringerNatureLink Shop INT 118,00 EUR 15,00 EUR 133,00 EUR 구매 가능 3일 전 View offer

가격과 재고 여부는 변경될 수 있습니다. 마지막 업데이트: 08.08.2026 23:21.

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The significant progress achieved in modern instrumental analysis has led to a continuous lowering of detection limits and improved precision. This should in principle permit the reliable and extremely precise analysis of trace compounds mainly trace elements, at levels down to the lowest natural concentrations. However, the frequently observed very high discrepancies between the analyt­ ical results of different laboratories as well as the deviations from true values are, regrettably, still common in analytical practice. Basic methodological errors at the determination step can usually be minimized or even avoided by carefully per­ formed quality control measures - e. g. by interlaboratory comparisons and the proper use of certified reference materials. The most severe and often under­ estimated error sources, however, are those connected with the whole and often extremely complex sampling process, and also to a lesser extent, with sample pre­ paration prior to analysis. Thus, for these initial steps of an analytical procedure particular experience is needed, as well as a detailed knowledge of the interrela­ tions between these steps, which always have to be applied with the utmost care. In collaboration with a number of very experienced colleagues working in dif­ book has tried to contribute to a better ferent research areas, the editor of this understanding of these particular error sources and how they can be overcome in a series of training courses held during the last decade at the "Haus der Technik", Essen, Germany.

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