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Scanning Electron Microscopy

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50 049,00 JPY

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Lowest (90 days)307,00 PLN

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2026-08-08 2026-08-15

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2026-08-08	307,00
2026-08-15	363,99

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SP SpringerNatureLink Shop INT	50 049,00 JPY	free	50 049,00 JPY	Disponibile	6 giorni fa	View offer
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SP SpringerNatureLink Shop INT	379,00 USD	free	379,00 USD	Disponibile	6 giorni fa	View offer
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SP SpringerNatureLink Shop INT	413,00 EUR	free	413,00 EUR	Disponibile	6 giorni fa	View offer

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EAN 9783540639763

Springer Nature

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.