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Point Processes for Reliability Analysis

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Point Processes for Reliability Analysis
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139,09 USD
Typical price180,40 PLN
Lowest (90 days)139,09 PLN
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Last updatedil y a 3 jours
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2026-08-08 2026-08-15
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2026-08-08139,09
2026-08-15149,99
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SP SpringerNatureLink Shop INT 139,09 USD free 139,09 USD Disponible il y a 3 jours View offer
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SP SpringerNatureLink Shop INT 169,99 USD 29,00 USD 198,99 USD Disponible il y a 3 jours View offer
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SP SpringerNatureLink Shop INT 199,99 USD free 199,99 USD Disponible il y a 3 jours View offer
SP Springer Nature Author 199,99 USD 15,00 USD 214,99 USD Disponible il y a 1 semaine View offer
SP SpringerNatureLink Shop INT 186,99 EUR free 186,99 EUR Disponible il y a 3 jours View offer

Les prix et la disponibilité peuvent changer. Dernière mise à jour: 15.08.2026 06:38.

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Focusing on the theory and applications of point processes, Point Processes for Reliability Analysis naturally combines classical results on the basic and advanced properties of point processes with recent theoretical findings of the authors. It also presents numerous examples that illustrate how general results and approaches are applied to stochastic description of repairable systems and systems operating in a random environment modelled by shock processes.   The real life objects are operating in a changing, random environment. One of the ways to model an impact of this environment is via the external shocks occurring in accordance with some stochastic point processes. The Poisson (homogeneous and nonhomogeneous) process, the renewal process and their generalizations are considered as models for external shocks affecting an operating system. At the same time these processes model the consecutive failure/repair times of repairable engineering systems. Perfect, minimaland intermediate (imperfect) repairs are discussed in this respect.  Covering material previously available only in the journal literature, Point Processes for Reliability Analysis provides a survey of recent developments in this area which will be invaluable to researchers and advanced students in reliability engineering and applied mathematics.

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